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Scanning electron microscope / Electron microscope / Environmental scanning electron microscope / Electron beam lithography / Double-click / Mouse / GUI widget / Focused ion beam / Scientific method / Electron microscopy / Science
Date: 2015-05-06 04:34:53
Scanning electron microscope
Electron microscope
Environmental scanning electron microscope
Electron beam lithography
Double-click
Mouse
GUI widget
Focused ion beam
Scientific method
Electron microscopy
Science

Revision 1.0 XL30 ESEM with NPGS SOP This is a shortened version that focuses mainly on routine operation. For more detailed instructions, please refer to the user manual “XL-30” and “Nanometer Pattern Generation

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