FRAUNHOFER-INSTITUT FÜR I nte g rierte S y ste m e un d B aue l e m entete c hno l o g ie I I S B FAILURE ANALYSIS AND

First Page		Document Content
Date: 2015-06-09 04:45:02 Scanning capacitance microscopy Characterization Electron microscope Scanning probe microscopy Failure analysis Transmission electron microscopy Focused ion beam Scanning electron microscope Energy-dispersive X-ray spectroscopy Scientific method Science Electron microscopy		FRAUNHOFER-INSTITUT FÜR I nte g rierte S y ste m e un d B aue l e m entete c hno l o g ie I I S B FAILURE ANALYSIS AND Add to Reading List Source URL: www.iisb.fraunhofer.de Download Document from Source Website File Size: 508,12 KB Share Document on Facebook

	IEEE TRANSACTIONS ON MAGNETICS, VOL. 37, NO. 4, JULYMagnetic Properties of Fe Microstructures with Focused Ion Beam-Fabricated Nano-Constrictions DocID: 1vfvg - View Document
	Physical Geography, 2013 Vol. 34, No. 3, 159–173, http://dx.doi.orgVarnish microlaminations: new insights from focused ion beam preparation David Krinsleya, Jeffrey Dittob, Kurt Langworthy DocID: 1sq0k - View Document
	Nano Wired V O L U M E NREC MISSION  DocID: 1qzYt - View Document
	SCANNING VOL. 33, 78–) & Wiley Periodicals, Inc. Investigation of Tibetian Plateau Varnish: New Findings at the Nanoscale Using Focused Ion Beam and Transmission Electron Microscopy Techniques DocID: 1pOa6 - View Document
	Precambrian Research–54 Focussed ion beam preparation and in situ nanoscopic study of Precambrian acritarchs Andr´e Kempe a,1 , Richard Wirth b , Wladyslaw Altermann c,∗ , Robert W. Stark a , J. Willi DocID: 1p8Ij - View Document