 Date: 2009-06-24 12:40:33Atomic physics Molecular physics Condensed matter physics Spectroscopy Quantum chemistry X-ray photoelectron spectroscopy Electronvolt Yield Work function Scanning electron microscope Ionization energy | |  SURFACE AND INTERFACE ANALYSIS Surf. Interface Anal. 2005; 37: 895–900 Published online in Wiley InterScience (www.interscience.wiley.com). DOI: sia.2107 A new examination of secondary electron yield data Yingh
Add to Reading ListSource URL: psec.uchicago.eduDownload Document from Source Website File Size: 159,02 KBShare Document on Facebook
|
