<--- Back to Details
First PageDocument Content
Electron microscopy / Nanotechnology / Materials science / Chemistry / Learning / Electron beam / Microtechnology / Carnegie Mellon University / National Robotics Engineering Center / Electron microscope / Microelectromechanical systems / Focused ion beam
Date: 2011-06-23 18:14:49
Electron microscopy
Nanotechnology
Materials science
Chemistry
Learning
Electron beam
Microtechnology
Carnegie Mellon University
National Robotics Engineering Center
Electron microscope
Microelectromechanical systems
Focused ion beam

Nano Wired V O L U M E NREC MISSION 

Add to Reading List

Source URL: nnrc.eng.usf.edu

Download Document from Source Website

File Size: 1,86 MB

Share Document on Facebook

Similar Documents

Microscopy Imaging Center (MIC)  MIC Workshop: IMOD software for electron tomography

Microscopy Imaging Center (MIC) MIC Workshop: IMOD software for electron tomography

DocID: 1vieY - View Document

© The Royal Microscopical Society  ● A special issue on Environmental Electron Microscopy (ESEM, ETEM, gas/liquid cells) ● based on communications presented at EMC2016

© The Royal Microscopical Society ● A special issue on Environmental Electron Microscopy (ESEM, ETEM, gas/liquid cells) ● based on communications presented at EMC2016

DocID: 1v9b2 - View Document

PHYSICAL AND CHEMICAL IMPACTS ON THE INTEGRITY OF CERATIUM CELLS: A SCANNING ELECTRON MICROSCOPY INVESTIGATION AFTER CONVENTIONAL SEDIMENTATION H. Ewerts1, 2, S. Barnard1 & A. Swanepoel2 1

PHYSICAL AND CHEMICAL IMPACTS ON THE INTEGRITY OF CERATIUM CELLS: A SCANNING ELECTRON MICROSCOPY INVESTIGATION AFTER CONVENTIONAL SEDIMENTATION H. Ewerts1, 2, S. Barnard1 & A. Swanepoel2 1

DocID: 1v2se - View Document

Deep Learning for Isotropic Super-Resolution from Non-Isotropic 3D Electron Microscopy arXiv:1706.03142v1 [cs.CV] 9 JunLarissa Heinrich, John A. Bogovic, Stephan Saalfeld

Deep Learning for Isotropic Super-Resolution from Non-Isotropic 3D Electron Microscopy arXiv:1706.03142v1 [cs.CV] 9 JunLarissa Heinrich, John A. Bogovic, Stephan Saalfeld

DocID: 1v2hf - View Document

Symposium of the Microscopy Imaging Center  MIC Big data in light and electron microscopy

Symposium of the Microscopy Imaging Center MIC Big data in light and electron microscopy

DocID: 1uWgw - View Document