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Scanning electron microscope / Focused ion beam / Electron microscope / Aspex / Lehigh Valley / Electron diffraction / Bruker / Transmission electron microscopy / Electron backscatter diffraction / Scientific method / Electron microscopy / Science


WORLD’S BEST Non-Profit Org. US Postage PAID Permit No 504 Lehigh Valley, PA
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Document Date: 2014-10-20 13:29:21


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Company

Hitachi High Technologies America Inc. / EDAX Inc. / LLC Denton Vacuum Inc. / JEOL USA Inc. / U S A / HKL Technology Inc. / HeElIonics LLC / Nion Company Oxford Instruments Protochips Inc. / E. A. Fischione Instruments Inc. / Thermo Fisher Scientific / IXRF Systems Inc. / Gatan Inc. / Agilent Technologies ASPEX LLC / EVEX FEI Company Gatan Inc. / L.A. Giannuzzi & Associates LLC / /

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Facility

University Helen Chan / University of Michigan Joe Michael / University of Massachusetts Richard Hertzberg / Lehigh University / University Frank Platek / /

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IndustryTerm

software tools / analysis software / imaging / Discover new technologies / food / /

Organization

Battelle Memorial Institute / University of Massachusetts / American University / University of Michigan / FDA / Lehigh University / SUNY / Whitaker Lab / Central Michigan University / Washington University / /

Person

RAY MICROANALYSIS / Dan Kremser / Carter / Nicholas Ritchie / Carol Kiely / Joe Goldstein / John Armstrong / Williams / Robert Keyse / John Mansfield / Dale Newbury / Masashi Watanabe / John Henry Scott / Chris Kiely / Bradley Thiel / Bob Anderhalt / Lucille A. Giannuzzi / Bill Thompson / Charles Lyman / John Hunt / Bill Mushock / Phil Oshel / Eric Lifshin / Paul Carpenter / Sharon Coe / /

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Position

Editor / Course Lecturer MSA President / MAS President / Consultant / analyst / /

ProgrammingLanguage

L / /

ProvinceOrState

Pennsylvania / /

Region

Central Michigan / /

Technology

X-ray / tomography / /

URL

www.lehigh.edu/microscopy / /

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