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Physics / Transmission electron microscopy / Electron microscope / Microscope / Nanotechnology / Focused ion beam / Optical microscope / Scanning electron microscope / Characterization / Scientific method / Electron microscopy / Science


Document Date: 2012-01-24 21:23:23

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File Size: 1,15 MB

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Company

Data Analysis Software / /

Continent

Europe / /

Country

Japan / United States / /

Currency

JPY / /

Facility

Yano Research Institute / /

IndustryTerm

semiconductor manufacturing process / above products / high-tech / communication equipment / technology policies / measurement equipment / technology basic guidelines / manufacturing / biotechnology / analysis software / measurement devices / product / nanoscale equipment / energy / industrial fields i.e. microfabrication technology / /

Organization

Related Organization / Japan External Trade Organization / Yano Research Institute / Japanese Government / /

Position

Major / /

Technology

semiconductor / Laser / industrial fields i.e. microfabrication technology / semiconductors / biotechnology / /

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