<--- Back to Details
| First Page | Document Content | |
|---|---|---|
 Date: 2014-11-28 07:19:08Microscopy Microscope Electron microscope Scanning electron microscope Magnetic force microscope Optical microscope Scanning tunneling microscope Characterization Vibrational analysis with scanning probe microscopy Scientific method Scanning probe microscopy Science |
Add to Reading List |
PAUL SCHERRER INSTITUT Technology Transfer R&D Services | AFM Pulse tube on 295 K see line scanDocID: 1qJik - View Document |
 | PESA half page Jan 2013.inddDocID: 1qboh - View Document |
 | Application Note 088 full High-Resolution Imaging in Different Atomic Force Microscopy Modes • An operation of AFM microscope in a temperature-stable cabinet facilitates high-resolution studies and makes molecular-scDocID: 1mPBu - View Document |
 | Microsoft Word - Abstract-book_1st Bochum Workshop_20111011_1945.docDocID: 1mMR0 - View Document |
 | High-Resolution Imaging in Different Atomic Force Microscopy ModesDocID: 1k9XJ - View Document |