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Physics / Hardness tests / Focused ion beam / Scanning electron microscope / Transmission electron microscopy / Electron microscope / Contact mechanics / Hardness / Yield / Scientific method / Electron microscopy / Science
Date: 2014-03-17 10:46:22
Physics
Hardness tests
Focused ion beam
Scanning electron microscope
Transmission electron microscopy
Electron microscope
Contact mechanics
Hardness
Yield
Scientific method
Electron microscopy
Science

PHiTEM Platform for High Temperature Materials Scope of project With the establishing of the platform of high temperature materials and multi-scale characterisation of micro-structure and mechanical behaviour of these ma

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