![Physics / Hardness tests / Focused ion beam / Scanning electron microscope / Transmission electron microscopy / Electron microscope / Contact mechanics / Hardness / Yield / Scientific method / Electron microscopy / Science Physics / Hardness tests / Focused ion beam / Scanning electron microscope / Transmission electron microscopy / Electron microscope / Contact mechanics / Hardness / Yield / Scientific method / Electron microscopy / Science](https://www.pdfsearch.io/img/f39982291b0be8c0a7c9f2c5f3e53af3.jpg) Date: 2014-03-17 10:46:22Physics Hardness tests Focused ion beam Scanning electron microscope Transmission electron microscopy Electron microscope Contact mechanics Hardness Yield Scientific method Electron microscopy Science | | PHiTEM Platform for High Temperature Materials Scope of project With the establishing of the platform of high temperature materials and multi-scale characterisation of micro-structure and mechanical behaviour of these ma
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