<--- Back to Details
First PageDocument Content
Microscopy / Optical mineralogy / Petrology / Optical microscope / Scanning electron microscope / Electron microscope / Microscope / Vesicular texture / Thin section / Scientific method / Electron microscopy / Science
Date: 2006-07-24 17:28:55
Microscopy
Optical mineralogy
Petrology
Optical microscope
Scanning electron microscope
Electron microscope
Microscope
Vesicular texture
Thin section
Scientific method
Electron microscopy
Science

textural changes can be observed under an optical microscope in reflected light (Fig. 4): (i) Dark, narrow cleavage cracks running, in most cases, across the entire sample disc; as expected, such cracks are often par

Add to Reading List

Source URL: web.gps.caltech.edu

Download Document from Source Website

File Size: 1,02 MB

Share Document on Facebook

Similar Documents

TITLE “Single-pixel infrared and visible microscope” “Amorphous molybdenum silicon superconducting thin films” “Optical Metrology with Lights Orbital Angular Mometum”

TITLE “Single-pixel infrared and visible microscope” “Amorphous molybdenum silicon superconducting thin films” “Optical Metrology with Lights Orbital Angular Mometum”

DocID: 1uKsV - View Document

(SDSU_3Color_187+4525+Blk.eps)

(SDSU_3Color_187+4525+Blk.eps)

DocID: 1rqg5 - View Document

(SDSU_3Color_187+4525+Blk.eps)

(SDSU_3Color_187+4525+Blk.eps)

DocID: 1rq0y - View Document

(SDSU_3Color_187+4525+Blk.eps)

(SDSU_3Color_187+4525+Blk.eps)

DocID: 1rp2H - View Document

(SDSU_3Color_187+4525+Blk.eps)

(SDSU_3Color_187+4525+Blk.eps)

DocID: 1rmSI - View Document