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Focused ion beam / Electron microscope / Bruker / Transmission electron microscopy / JEOL / Microscope / Microscopy / Scanning electron microscope / Scientific method / Electron microscopy / Science


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Document Date: 2014-11-21 07:57:24

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Company

Producer SDK Biotechnologies Biolin Scientific Horiba Plasmore SRL / IZon Jasco Corp. / Agilent Technologies / Producer JEOL Ltd. / Kratos Analytical Ltd. / AF2000 MT Postnova Analytics CF2000 CPS Instruments Inc. / EPIC / LEICA CEM Corporation / GE / Bruker Bruker ION-TOF GmbH / PerkinElmer / Malvern Instruments Ltd / J.A. Woollam CO. Inc. / Au Ag / LEICA GEA Mechanical Equipment SpA / /

Facility

Special laboratory / EUROPEAN COMMISSION JOINT RESEARCH CENTRE Institute / TOF GmbH Kratos Analytical Ltd. LEICA CEM Corporation LEICA GEA Mechanical Equipment SpA / /

IndustryTerm

physico-chemical characterisation / /

Organization

EUROPEAN COMMISSION JOINT RESEARCH CENTRE Institute for Health and Consumer Protection Nanobiosciences Unit NanoBiotechnology Laboratory Technical / Nanobiosciences Unit / /

Person

Ion Etching / Ray Photoelectron Spectroscopy / Ion Beam Sputtering / /

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Position

spectrometry Producer / printer Mask Aligner Producer / /

Product

J-815 Nicolet / PLEX Impressor 1.0 Micro-Nano Fabrication Instrument / /

ProgrammingLanguage

DC / /

Technology

Microwave / polymerization / /

SocialTag