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Diffraction / Electron microscopy / Spectroscopy / Electron backscatter diffraction / Scanning electron microscope / Crystallography / Electron / Scientific method / Physics / Science


Crystal pattern mapping can recover obliterated serial numbers in metals
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Document Date: 2015-04-16 18:47:00


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File Size: 37,10 KB

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Company

Los Alamos National Laboratory / /

Facility

National Institute of Standards and Technology / /

IndustryTerm

metal grains / metal / metal objects / stainless steel / polished stainless steel plate / metal deformation / law enforcement / steel / /

Organization

National Institute of Standards and Technology / Institute of Standards and Technology APA / /

Person

Laura Ost / Carl Necker / /

Position

technician / /

URL

www.tcpdf.org / http /

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