![Physics / Microscopes / Electron beam / Electron energy loss spectroscopy / Spectroscopy / Electron microscope / Scanning transmission electron microscopy / Electron / Transmission electron microscopy / Scientific method / Electron microscopy / Science Physics / Microscopes / Electron beam / Electron energy loss spectroscopy / Spectroscopy / Electron microscope / Scanning transmission electron microscopy / Electron / Transmission electron microscopy / Scientific method / Electron microscopy / Science](https://www.pdfsearch.io/img/56f19dd7a89be2d22b87fc324ba8c13c.jpg) Date: 2011-05-19 17:42:40Physics Microscopes Electron beam Electron energy loss spectroscopy Spectroscopy Electron microscope Scanning transmission electron microscopy Electron Transmission electron microscopy Scientific method Electron microscopy Science | | Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com)Add to Reading ListSource URL: depts.washington.eduDownload Document from Source Website File Size: 170,19 KBShare Document on Facebook
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