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Scanning probe microscopy / Electron microscopy / Microscopy / Scanning thermal microscopy / Materials science / Microscopes / Thermal conductivity / Electron microscope / Thermal analysis / Science / Scientific method / Chemistry


Document Date: 2009-10-06 18:00:00

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File Size: 2,48 MB

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City

Fort Lee / /

Company

Anasys Instruments / SThM / nano-TA / Static Mode Topography / Nanosurf AG / Nanosurf Inc / /

Country

United States / /

Event

M&A / /

Facility

Wheatstone bridge / /

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IndustryTerm

electronics / less energy / easyScan systems / imaging / software interface / Thermal conductivity imaging / energy / thermal analysis electronics / /

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Position

controller / /

Product

easyScan 2 FlexAFM / /

ProvinceOrState

New Jersey / /

Technology

laser / /

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