Oxford University Press / Applied Materials Inc. / Neural Networks / Radial Basis Function Neural Networks / /
Country
Israel / /
Facility
Ben-Gurion University / /
IndustryTerm
k-means algorithm / data mining applications / automatic classification tool / heavy random search model / soft computing / genetic algorithm / optimization algorithm / classification processing time / heavy random search / well-developed technology / trivial solution / genetic algorithms / lithographic printing / evolutionary classification tool / image classification tool / feed-forward network / intricate algorithms / reasonable solution / search space / basis function networks / manufacturing problems / classification tool / classified product / /
OperatingSystem
XP / /
Organization
Israeli Ministry of Industry / Trade / and Employment / Ben-Gurion University / William Frankel Center for Computer Science / Oxford University / /
Person
David Sanchez / Wai Cho / Wai Mak / Choate / /
Position
defect controller / basic model / showing almost identical behavior / enhanced evolutionary model for the defect classification problem / Bishop / enhanced model / showing almost identical behavior / T.D. / controller / frequent skilled Customer Engineer / /
Evolving an Automatic Defect Classification Tool Assaf Glazer1,2 and Moshe Sipper1 1 Dept. of Computer Science, Ben-Gurion University,