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Electronic engineering / Serial Vector Format / Joint Test Action Group / Boundary scan / Xilinx / Datapath / Electronics manufacturing / Manufacturing / Electronics
Date: 2013-03-04 06:00:09
Electronic engineering
Serial Vector Format
Joint Test Action Group
Boundary scan
Xilinx
Datapath
Electronics manufacturing
Manufacturing
Electronics

Xilinx XAPP503, SVF and XSVF File Formats for Xilinx Devices, Application Note

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