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Electronics / Boundary scan / Joint Test Action Group / Serial Vector Format / Functional testing / Digital electronics / Test / Printed circuit board / Boundary scan description language / Electronics manufacturing / Manufacturing / Electronic engineering
Date: 2001-10-24 14:26:06
Electronics
Boundary scan
Joint Test Action Group
Serial Vector Format
Functional testing
Digital electronics
Test
Printed circuit board
Boundary scan description language
Electronics manufacturing
Manufacturing
Electronic engineering

Boundary-Scan Tutorial Boundary-Scan Tutorial

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