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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Failure Analysis of Power MOSFETs based on Multifinger Configuration under Unclamped Inductive Switching (UIS) Stress Condition **Karuna Nidhia, **Neelam Agarwala, Shao-
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Document Date: 2013-02-12 08:39:10
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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Failure Analysis of Power MOSFETs based on Multifinger Configuration under Unclamped Inductive Switching (UIS) Stress Condition **Karuna Nidhia, **Neelam Agarwala, Shao-