<--- Back to Details
First PageDocument Content
Electronic design / MOSFET / Integrated circuits / Threshold voltage / Multigate device / CMOS / Field-effect transistor / Short-channel effect / Power MOSFET / Electrical engineering / Electronic engineering / Electromagnetism
Date: 2010-08-24 11:11:24
Electronic design
MOSFET
Integrated circuits
Threshold voltage
Multigate device
CMOS
Field-effect transistor
Short-channel effect
Power MOSFET
Electrical engineering
Electronic engineering
Electromagnetism

Microsoft PowerPoint - WCM2010 [Compatibility Mode]

Add to Reading List

Source URL: www.techconnectworld.com

Download Document from Source Website

File Size: 207,89 KB

Share Document on Facebook

Similar Documents

Leti_NR_UTSOI2_FINAL_11 03 15

Leti_NR_UTSOI2_FINAL_11 03 15

DocID: 1fHLd - View Document

G. Liu, W. Stillman, S. Rumyantsev, Q. Shao, M. Shur and A.A. Balandin, Low-noise top-gate graphene transistorsLow-noise top-gate graphene transistors G. Liu1, W. Stillman2, S. Rumyantsev2,3, Q. Shao1,4, M. Shur

G. Liu, W. Stillman, S. Rumyantsev, Q. Shao, M. Shur and A.A. Balandin, Low-noise top-gate graphene transistorsLow-noise top-gate graphene transistors G. Liu1, W. Stillman2, S. Rumyantsev2,3, Q. Shao1,4, M. Shur

DocID: 1fGuC - View Document

Statistical variability shapes the future of CMOS Keynote talk from the CEO of GSS at the DATE VAMM Workshop The CEO of Gold Standard Simulations, Professor Asen Asenov, will deliver a keynote talk on variability in emer

Statistical variability shapes the future of CMOS Keynote talk from the CEO of GSS at the DATE VAMM Workshop The CEO of Gold Standard Simulations, Professor Asen Asenov, will deliver a keynote talk on variability in emer

DocID: 1aK0w - View Document

Center for Low Energy Systems Technology (LEAST)

Center for Low Energy Systems Technology (LEAST)

DocID: 19KGs - View Document

KAUST Repository (Invited) Wavy Channel TFT Architecture for High Performance Oxide Based Displays

KAUST Repository (Invited) Wavy Channel TFT Architecture for High Performance Oxide Based Displays

DocID: 19CJ9 - View Document