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Electrical engineering / Analog-to-digital converter / Effective number of bits / Quantization error / Spurious-free dynamic range / Delta-sigma modulation / Digital-to-analog converter / SINAD / Sampling / Digital signal processing / Electronics / Electromagnetism


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Document Date: 2007-05-16 17:24:55

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City

Gaithersburg / Lisbon / Boston / /

Company

Richard Liggiero Annex B Testing / Teradyne / Las Vegas NV / Robert Graham Sandia National Laboratories / Richard Liggiero LTX Corporation / /

Country

United States / /

Currency

USD / NAD / /

/

Facility

Eulalia Balestrieri University of Sannio / Pasquale Daponte University of Sannio / /

Organization

ADC Test Committee / University of Sannio / Standards Committee / /

Person

Sol Max / Jerry Blair Solomon Max / Solomon Max Jerry Blair / Jerry Blair / Tom Linnenbrink / Steve Tilden / Solomon Max / Solomon Max Fang Xu / Francisco Alegria Instituto Superior Tecnico / David Bergman / Tom Linnenbrink Hittite / Jerry Blair Bechtel Nevada / /

Position

chairman / secretary / /

ProvinceOrState

Maryland / /

RadioStation

AM 1 / /

Technology

ADC / spectroscopy / /

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