![Electronic engineering / Digital-to-analog converter / Analog-to-digital converter / Sampling / Spurious-free dynamic range / Differential nonlinearity / Quantization error / Effective number of bits / Signal-to-noise ratio / Digital signal processing / Electronics / Electromagnetism Electronic engineering / Digital-to-analog converter / Analog-to-digital converter / Sampling / Spurious-free dynamic range / Differential nonlinearity / Quantization error / Effective number of bits / Signal-to-noise ratio / Digital signal processing / Electronics / Electromagnetism](/pdf-icon.png) Date: 2008-03-03 15:23:27Electronic engineering Digital-to-analog converter Analog-to-digital converter Sampling Spurious-free dynamic range Differential nonlinearity Quantization error Effective number of bits Signal-to-noise ratio Digital signal processing Electronics Electromagnetism | | P1658 Digital to Analog Standard Meeting, February 21, 2008 Attendees: Steve Tilden, Texas Instruments (Chair) [removed] Robert Graham, Sandia National Labs., Albuquerque, NM USA [removed]Add to Reading ListSource URL: grouper.ieee.orgDownload Document from Source Website File Size: 512,93 KBShare Document on Facebook
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