N1.13 Scanning Tunneling Microscopy of Silicon Surfaces Albert Liu With the decreasing scale of microelectronics and nanotechnology, knowledge of the properties of metal and semiconductor surfaces at the atomic scale is

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Date: 2014-10-02 04:23:39 Scanning probe microscopy Microscopes Emerging technologies Microscopy Scanning tunneling microscope Nanotechnology Silicene		N1.13 Scanning Tunneling Microscopy of Silicon Surfaces Albert Liu With the decreasing scale of microelectronics and nanotechnology, knowledge of the properties of metal and semiconductor surfaces at the atomic scale is Document is deleted from original location. Use the Download Button below to download from the Web Archive. Download Document from Web Archive File Size: 12,39 KB

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