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Fabless semiconductor companies / Electronics manufacturing / Joint Test Action Group / Field-programmable gate array / Actel / Microsemi / Backdoor / Microcontroller / Application-specific integrated circuit / Electronic engineering / Electronics / Embedded systems
Date: 2012-09-07 13:28:11
Fabless semiconductor companies
Electronics manufacturing
Joint Test Action Group
Field-programmable gate array
Actel
Microsemi
Backdoor
Microcontroller
Application-specific integrated circuit
Electronic engineering
Electronics
Embedded systems

Breakthrough silicon scanning discovers backdoor in military chip CHES2012 Workshop, Leuven, Belgium, 9-12 September 2012 Breakthrough silicon scanning discovers backdoor in military chip

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