![Fabless semiconductor companies / Electronics manufacturing / Joint Test Action Group / Field-programmable gate array / Actel / Microsemi / Backdoor / Microcontroller / Application-specific integrated circuit / Electronic engineering / Electronics / Embedded systems Fabless semiconductor companies / Electronics manufacturing / Joint Test Action Group / Field-programmable gate array / Actel / Microsemi / Backdoor / Microcontroller / Application-specific integrated circuit / Electronic engineering / Electronics / Embedded systems](https://www.pdfsearch.io/img/1933eba96e890d07cd02a27e7b189ee6.jpg) Date: 2012-09-07 13:28:11Fabless semiconductor companies Electronics manufacturing Joint Test Action Group Field-programmable gate array Actel Microsemi Backdoor Microcontroller Application-specific integrated circuit Electronic engineering Electronics Embedded systems | | Breakthrough silicon scanning discovers backdoor in military chip CHES2012 Workshop, Leuven, Belgium, 9-12 September 2012 Breakthrough silicon scanning discovers backdoor in military chipAdd to Reading ListSource URL: www.cl.cam.ac.ukDownload Document from Source Website File Size: 723,05 KBShare Document on Facebook
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