![Software / Estimation theory / Statistics / Machine learning / Application software / Actuarial science / Regression analysis / SPICE / Pattern recognition / Linear regression / Structural estimation / Semiconductor device modeling Software / Estimation theory / Statistics / Machine learning / Application software / Actuarial science / Regression analysis / SPICE / Pattern recognition / Linear regression / Structural estimation / Semiconductor device modeling](https://www.pdfsearch.io/img/5b57486eacfa0ba2509265bf7e5133f2.jpg) Date: 2015-08-19 06:57:43Software Estimation theory Statistics Machine learning Application software Actuarial science Regression analysis SPICE Pattern recognition Linear regression Structural estimation Semiconductor device modeling | | Fast Process Variation Analysis in Nano-Scaled Technologies Using Column-Wise Sparse Parameter Selection Hassan Ghasemzadeh Mohammadi∗ , Pierre-Emmanuel Gaillardon∗ , Majid Yazdani† , Giovanni De Micheli∗ IntegraAdd to Reading ListSource URL: majid.yazdani.meDownload Document from Source Website File Size: 851,08 KBShare Document on Facebook
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