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Software / Estimation theory / Statistics / Machine learning / Application software / Actuarial science / Regression analysis / SPICE / Pattern recognition / Linear regression / Structural estimation / Semiconductor device modeling
Date: 2015-08-19 06:57:43
Software
Estimation theory
Statistics
Machine learning
Application software
Actuarial science
Regression analysis
SPICE
Pattern recognition
Linear regression
Structural estimation
Semiconductor device modeling

Fast Process Variation Analysis in Nano-Scaled Technologies Using Column-Wise Sparse Parameter Selection Hassan Ghasemzadeh Mohammadi∗ , Pierre-Emmanuel Gaillardon∗ , Majid Yazdani† , Giovanni De Micheli∗ Integra

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