<--- Back to Details
First PageDocument Content
Engineering / Software testing / ISO/IEC 29119 / Test automation / Standardized test / Cem Kaner / Positive deviance / Safety / Software engineering / Reliability engineering / Professional certification / Software testing controversies
Date: 2012-06-06 18:00:58
Engineering
Software testing
ISO/IEC 29119
Test automation
Standardized test
Cem Kaner
Positive deviance
Safety
Software engineering
Reliability engineering
Professional certification
Software testing controversies

Acknowledgements Standards and Deviations: The Role of Routine in Testing Michael Bolton DevelopSense http://www.developsense.com

Add to Reading List

Source URL: www.developsense.com

Download Document from Source Website

File Size: 795,78 KB

Share Document on Facebook

Similar Documents

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

DocID: 1vkXP - View Document

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

DocID: 1urDX - View Document

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

DocID: 1ukgt - View Document

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

DocID: 1u7ws - View Document

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

DocID: 1tIgr - View Document