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Standard dynamic range
Results: 16

#	Item
11	Minutes of 1241 Standards Committee Meeting in Tucson, Arizona USA – February 19, 2009 Minutes Prepared by: Solomon Max – 2005-March-12 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2009-03-18 16:42:16 Electronics Electromagnetism Analog-to-digital converter Spurious-free dynamic range Flash ADC Sampling Digital signal processing Electronic circuits Electronic engineering
12	P1658 Digital to Analog Standard Meeting, February 21, 2008 Attendees: Steve Tilden, Texas Instruments (Chair) [removed] Robert Graham, Sandia National Labs., Albuquerque, NM USA [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-03-03 15:23:27 Electronic engineering Digital-to-analog converter Analog-to-digital converter Sampling Spurious-free dynamic range Differential nonlinearity Quantization error Effective number of bits Signal-to-noise ratio Digital signal processing Electronics Electromagnetism
13	Minutes of March 17, 2004 TC-10 Meeting in Boulder, Colorado Draft Standard for Terminology and Test Methods for Digital to Analog Converters Attendance: Steve Tilden Tom Linnenbrink Bill Boyer Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2004-04-27 12:19:28 Technology Digital-to-analog converter Spurious-free dynamic range Signal generator Differential nonlinearity Effective number of bits Integral nonlinearity Digital signal processing Electronics Electromagnetism
14	1241 Analog to Digital Standard Meeting, September 24, 2008 Modified – November 7, 2008 Location: Florence, (Italy) Attendees: Tom Linnenbrink, Hittite, (Chair, TC-10) [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-11-07 15:25:47 SINAD SHA Solomon Tilden Technology Hebrew Bible Old Testament Digital signal processing Analog-to-digital converter Spurious-free dynamic range
15	Minutes of P1658 Standards Committee Meeting in Albuquerque, New Mexico USA – November 2, 2006 Minutes Prepared by: Solomon Max – [removed]November 28 Draft Standard for Terminology and Test Methods for Digital to Anal Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-11-28 09:03:22 Electronic engineering Jitter Analog-to-digital converter Digital-to-analog converter Sampling Phase noise Quantization Data-dependent jitter Spurious-free dynamic range Digital signal processing Electronics Electromagnetism
16	PDF Document Add to Reading List Source URL: msu.euramet.org Language: English - Date: 2014-06-13 11:26:01 International System of Units Standard Kilogram National Institute of Standards and Technology Dynamic range Structured-light 3D scanner Nanometrology Measurement Metrology Focus variation

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