IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, SPECIAL ISSUE, VOL. 6, NO. 1, DECEMBERA Combined Design-Time Test-Time Study of the Vulnerability of Sub-Threshold Devices to - Standard time - Document - PDFSEARCH.IO

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Date: 2014-03-28 15:45:17 Cryptography Stream ciphers Advanced Encryption Standard Differential fault analysis Block cipher VEST Data Encryption Standard Fault model Fault injection Side-channel attack Common Scrambling Algorithm		IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, SPECIAL ISSUE, VOL. 6, NO. 1, DECEMBERA Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Add to Reading List Source URL: euler.ecs.umass.edu Download Document from Source Website File Size: 1,53 MB Share Document on Facebook

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