![Deformation / Plasticity / Crystallographic defects / Dislocation / Yield / Annealing / Czochralski process / Strengthening mechanisms of materials / Materials science / Mechanics / Solid mechanics Deformation / Plasticity / Crystallographic defects / Dislocation / Yield / Annealing / Czochralski process / Strengthening mechanisms of materials / Materials science / Mechanics / Solid mechanics](https://www.pdfsearch.io/img/c2b8da52f847e2f3d62569bb04ef4c96.jpg)
| Document Date: 2007-12-19 12:33:48 Open Document File Size: 290,20 KBShare Result on Facebook
City New York / Oxford / / Company Elsevier B.V. / MEMC Electronic Materials SpA / John Wiley & Sons / / Country United Kingdom / / / Facility University of Oxford / / / IndustryTerm device processing / chemical / energy / / Organization Department of Materials / University of Oxford / / Person Robert J. Falster Peter / Peter R. Wilshaw / / Position Corresponding author / / ProvinceOrState New York / / Technology IC technologies / integrated circuits / / URL www.elsevier.com/locate/commatsci / /
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