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International System of Units / Standard / Kilogram / National Institute of Standards and Technology / Dynamic range / Structured-light 3D scanner / Nanometrology / Measurement / Metrology / Focus variation


Document Date: 2014-06-13 11:26:01

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plastic electronics / large-area electronics / Large-substrate-based manufacturing throws / sheet-based and roll-to-roll applications / Vision-based metrology solutions / parallel manufacturing methods / manufacturing environment / industrial manufacturing environments / improved products / electronics / metrological technology / screen printing / high throughput manufacturing / measurement technologies / range manufacturing / measurement infrastructure / throughput surface measurement technology / traceability infrastructure / manufacturing / disruptive technologies / metrology solutions / real-time process control / parallel manufacturing sector / /

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European Union / /

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developed measurement technologies / laser / high throughput surface measurement technology / process control / /

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