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Crystals / Semiconductor growth / Crystallographic defects / Crystallography / Dislocation / Crystal growth / Silicon / Czochralski process / Crystal / Chemistry / Materials science / Matter


Journal of Crystal Growth–313 Stress-induced dislocation generation in large FZ- and CZ-silicon single crystals}numerical model and qualitative considerations a
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Document Date: 2003-02-27 08:19:22


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