<--- Back to Details
First PageDocument Content
Sociology / Risk / Complex systems theory / High reliability organization / Organizational theory / Survival analysis / Reliability engineering / Sensemaking / Safety culture / Management / Knowledge / Science
Date: 2009-02-02 15:22:34
Sociology
Risk
Complex systems theory
High reliability organization
Organizational theory
Survival analysis
Reliability engineering
Sensemaking
Safety culture
Management
Knowledge
Science

Journal of Contingencies and Crisis Management (BWUK JCCM 564.PDF 23-Dec-08 19:Bytes 5 PAGES n operator=T.Prasath) 1 2

Add to Reading List

Source URL: ccrm.berkeley.edu

Download Document from Source Website

File Size: 421,45 KB

Share Document on Facebook

Similar Documents

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

DocID: 1vkXP - View Document

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

DocID: 1urDX - View Document

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

DocID: 1ukgt - View Document

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

DocID: 1u7ws - View Document

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

DocID: 1tIgr - View Document