Orlando / Barcelona / Cork / Zagreb / New York / Oxford / /
Company
ARTICLE IN PRESS / Y.J. Cho N.V. / Pergamon Press / Thin Solid Films / B. Dieny A.E. / Elsevier B.V. / M. Ramon N.V. / X. Shi S.A. / /
Country
Spain / Ireland / / /
Facility
Tyndall National Institute / Croatia University College / /
IndustryTerm
metrology tool / chemical cleaning / manufacturing conditions / photon energy / good solutions / transition energy / structural characterization tool / energy dependence / high energy range / optical coating technology / peak transition energy / thin film computation algorithms / energy / using standard thin film computation algorithms / /
Organization
Ruđer Bošković Institute / Universitat de Barcelona / Government of Catalonia / Thin Film Division / Tyndall National Institute / /
Person
S. Lhostis / V / G.E. Jellison Jr. / G.E. Jellison Jr / D. Ha / Mircea Modreanu / Salvador Bosch / J. Vac / Jordi Sancho-Parramon / B.E. White Jr. / Lee Maltings / Michel Stchakovsky / /