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Electronics manufacturing / IEEE standards / Electronic test equipment / Electronic design automation / Signal integrity / Oscilloscope / Joint Test Action Group / Printed circuit board / Nexus / Electronics / Electronic engineering / Technology
Date: 2012-04-30 12:22:02
Electronics manufacturing
IEEE standards
Electronic test equipment
Electronic design automation
Signal integrity
Oscilloscope
Joint Test Action Group
Printed circuit board
Nexus
Electronics
Electronic engineering
Technology

How to overcome/avoid High Frequency Effects on Debug Interfaces – Trace Port Design Guidelines An On-Chip Debugger/Analyzer (OCD) like iSYSTEM’s iC5000 (Figure 1) acts as a link to the target hardware by standard de

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