![Technology / Joint Test Action Group / Boundary scan / 4G / 3GPP Long Term Evolution / LTE timeline / In-circuit test / Electronics manufacturing / Manufacturing / Electronics Technology / Joint Test Action Group / Boundary scan / 4G / 3GPP Long Term Evolution / LTE timeline / In-circuit test / Electronics manufacturing / Manufacturing / Electronics](https://www.pdfsearch.io/img/2470e3c611bd4666f354480732c151bc.jpg)
| Document Date: 2010-09-30 10:29:20 Open Document File Size: 759,37 KBShare Result on Facebook
City Dresden / / Company Blue Wonder Communications / LTE (Long Term Evolution) Semiconductors / / Country Germany / / Facility Loschwitz Bridge / Blue Wonder Bridge / Blue Wonder Communications HQ / / IndustryTerm large systems / Manufacturing partners / cellular networks / avoidable manufacturing defects / technology developer / non-standard devices / telecommunications industries / modem technology / online library / prototype hardware / memory devices / software development / / Organization US Federal Reserve / / Person Mario Riedel / / Position Hardware Development Engineer / / Technology Ethernet / Accelerators Application Processor Voice processing Storage digRF TRX RF Frontend Chip / semiconductors / X-ray / JTAG / DDR chips / GSM / Flash / system solutions Embedded modem technology / / URL www.bluwo.com / www.xjtag.com / /
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