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Application Note | AN109 Ultra-Fast xBTI Reliability Tests with ProChek™ Introduction This application note addresses how ProChek can serve to gather bias temperature instability (BTI) data from test structures that ar
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Document Date: 2015-07-18 01:30:08
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Application Note | AN109 Ultra-Fast xBTI Reliability Tests with ProChek™ Introduction This application note addresses how ProChek can serve to gather bias temperature instability (BTI) data from test structures that ar