Date: 2012-04-30 12:22:02Electronics manufacturing IEEE standards Electronic test equipment Electronic design automation Signal integrity Oscilloscope Joint Test Action Group Printed circuit board Nexus Electronics Electronic engineering Technology | | How to overcome/avoid High Frequency Effects on Debug Interfaces – Trace Port Design Guidelines An On-Chip Debugger/Analyzer (OCD) like iSYSTEM’s iC5000 (Figure 1) acts as a link to the target hardware by standard deAdd to Reading ListSource URL: www.isystem.comDownload Document from Source Website File Size: 605,34 KBShare Document on Facebook
|