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Electronics manufacturing / Electronic design automation / Boundary scan / Hardware description languages / Joint Test Action Group / Design for testing / Scan chain / Synchronous dynamic random-access memory / XNOR gate / Electronic engineering / Manufacturing / Electronics


STATIC COMPONENT INTERCONNECTION TEST TECHNOLOGY IN PRACTICE Frans de Jong, Rob Raaijmakers Philips Research, Philips CFT, The Netherlands Email: [removed], [removed] Steffen Hellmold
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Document Date: 2001-07-23 12:55:02

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File Size: 1,40 MB

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