Get 5 TEM sections made from your samples using FIB – ideal for orientation imaging and strain solutions at 1-5 nm resolution using ASTAR Digistar Topspin Autostrain. TEM sections can be machined from the top surface o - The Thin Ideal - Document - PDFSEARCH.IO

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	Get 5 TEM sections made from your samples using FIB – ideal for orientation imaging and strain solutions at 1-5 nm resolution using ASTAR/Digistar/Topspin/Autostrain. TEM sections can be machined from the top surface o Add to Reading List Document Date: 2014-09-02 15:58:01 Open Document File Size: 107,64 KB Share Result on Facebook Company NanoMEGAS / / / IndustryTerm orientation imaging / imaging / strain solutions / / Person Ion Beam / / Technology semiconductor / / URL http / SocialTag Semiconductor device fabrication Thin film deposition Chemistry Transmission electron microscopy Electron microscopy Science Focused ion beam

Get 5 TEM sections made from your samples using FIB – ideal for orientation imaging and strain solutions at 1-5 nm resolution using ASTAR/Digistar/Topspin/Autostrain. TEM sections can be machined from the top surface oAdd to Reading List