![](https://www.pdfsearch.io/img/c5547fa67d1e710685a7238edd8ed09e.jpg) Date: 2017-05-19 10:34:01
| | Adapting Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs Abstract—The efficiency and cost of silicon PUF-based applications, and in particular key generators, are heavily impacted by the levelAdd to Reading ListSource URL: boriskennes.wpengine.comDownload Document from Source Website File Size: 294,43 KBShare Document on Facebook
|