Jefferson Davis Highway / Mill St. / Headquarters Services / Reliability Analysis Center / /
IndustryTerm
device / parts/assemblies/equipment / publication unique devices / semiconductor devices / firms testing devices / states mat devices / bipolar device / microcircuit devices / passive devices / assembly/equipment / higher energy pulse / data conversion algorithms / /
Organization
OFFICE OF PRIMARY RESPONSIBILITY / Reliability Analysis Center / Directorate for Information Operations and Reports / DOCUMENT ORGANIZATION / DoD Information Analysis Center / office of Management and Budget / ESD Reliability Analysis Center / Department of Defense / Analysis Center / Test / /
Person
Electromagnetic Pulse / Voltage Step / William Denson / Slash / David Mahar / William Crowell / Paul Jaworski / / /
Position
contractor / ohm model / /
Product
RELI-80670 / /
ProgrammingLanguage
DC / /
ProvinceOrState
Virginia / New York / /
Technology
following algorithm / semiconductors / semiconductor devices / data conversion algorithms / simulation / integrated circuits / /
VZAP-95 Electrostatic Discharge Susceptibility Data[removed]Prepared by: William Denson, William Crowell, Paul Jaworski, David Mahar