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Chemistry / Nanotechnology / Magnetic force microscope / Atomic force microscopy / Cantilever / Focused ion beam / Microscopy / Scanning joule expansion microscopy / Thermal Probe Lithography / Scientific method / Scanning probe microscopy / Science
Date: 2011-08-28 10:51:13
Chemistry
Nanotechnology
Magnetic force microscope
Atomic force microscopy
Cantilever
Focused ion beam
Microscopy
Scanning joule expansion microscopy
Thermal Probe Lithography
Scientific method
Scanning probe microscopy
Science

IEEE TRANSACTIONS ON MAGNETICS, VOL. 38, NO. 5, SEPTEMBER[removed]The CantiClever: A Dedicated Probe for Magnetic Force Microscopy

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