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Growth of thiourea-doped TGS crystals and their characterisation K. Meeraa,*, R. Muralidharana, A.K. Tripathib, R. Dhanasekarana, P. Ramasamya,1 1
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Document Date: 2006-02-20 15:30:35


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City

Chennai / New Delhi / Springer / /

Company

Philips / Hewlett Packard / KBr / Nicolet Instrument Corporation / /

Country

India / /

Facility

Indian Institute of Technology / Anna University / /

IndustryTerm

aqueous solution / /

Organization

V Inji.i Department of Physics / Anna University / Indian Institute of Technology / New Delhi / /

Person

R. Muralidharan / M. Palanichamy / T.C. Goel / J. Crystal Growth / Crystal Growth / H.D. Sharma / K. Meera / /

Product

CuKa / /

ProvinceOrState

New York / /

Technology

radiation / X-ray / Dielectric / been carried out using Philips Powder X-ray diffractometer using CuKa radiation to identify the lattice parameters / /

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