Focused Ion Beam Services Nanostructuring, Failure Analysis, - Time to market - Document - PDFSEARCH.IO

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Date: 2015-06-08 13:41:23 Science Semiconductor device fabrication Thin film deposition Focused ion beam Ion beam Electron microscope Transmission electron microscopy Failure analysis Fib Scientific method Physics Electron microscopy		Focused Ion Beam Services Nanostructuring, Failure Analysis, & Rapid IC-Prototyping FhG IISB supports you in processing nanosized structures and helps you to shorten time to market for your ASICs. Focused Ion Beam (FIB) Add to Reading List Source URL: www.iisb.fraunhofer.de Download Document from Source Website File Size: 1,58 MB Share Document on Facebook

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