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MOSFET / Electronic design / Capacitance / Common source / Field-effect transistor / CMOS / Electromagnetism / Electronic engineering / Electronics


RF Modeling of 45nm Low-Power CMOS Technology Jing Wang*, Hongmei Li**, Li-Hong Pan*, Usha Gogineni***, Robert Groves*, Basanth Jagannathan*, Myung-Hee Na*, William Tonti** and Richard Wachnik* * IBM Semiconductor Resea
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Document Date: 2014-06-04 17:41:40

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Company

IBM / /

Country

United States / /

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Facility

port COMPLETE / Massachusetts Institute / /

IndustryTerm

indispensable and powerful tool / substrate resistance network / technology nodes / wirecap network / extracted wirecap network / test-site / circuit applications / /

Organization

U.S. Securities and Exchange Commission / /

Person

Robert Groves / Usha Gogineni / Q. Liang / Myung-Hee Na / Jing Wang / Richard Wachnik / William Tonti / /

ProvinceOrState

California / Massachusetts / /

Technology

RFCMOS technology / CMOS technology / Microwave / Radio Frequency / simulation / Integrated Circuits / 45nm RFCMOS technology / 45nm Low-Power CMOS Technology / /

URL

www.nsti.org / /

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