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Semiconductor device fabrication / Semiconductors / Electronic design / Integrated circuits / MOSFET / Negative bias temperature instability / Hot carrier injection / Transconductance / Threshold voltage / Electromagnetism / Electronics / Electronic engineering


Microsoft PowerPoint - WCM2011_698 [Compatibility Mode]
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Document Date: 2011-07-25 10:32:22

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File Size: 99,98 KB

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