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Electromagnetism / Reliability engineering / Electronic engineering / Failure analysis / Maintenance / Problem solving / Fault / Integrated circuit / Transistor / Semiconductor devices / Failure / Electrical engineering


Innovative Common Technologies to Support State-of-the-Art Products Failure Analysis Technology for Advanced Devices ISHIYAMA Toshio, WADA Shinichi, KUZUMI Hajime, IDE Takashi Abstract
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Document Date: 2013-10-01 21:40:17

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File Size: 1,42 MB

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Company

Sumitomo / NEC Electronics Corporation / LSI / /

Event

Product Issues / /

IndustryTerm

nanoprobe device / physical analysis technology / diagnostic technologies / implement devices / diagnosis algorithm / silicon chip / measuring technologies / manufacturing equipment / reaction site / failure analysis technology / failure analysis technologies / defective device / manufacturing / microscopic processing / defective devices / manufacturing processes / using this nanoprobe device / /

Organization

Analysis Engineering Division / Manufacturing Operations Unit / /

Person

Test / Takashi Team / Takashi Abstract / Shinichi Photo / /

Position

Manager / Proļ¬les ISHIYAMA Toshio Manager / KUZUMI Hajime Assistant Manager / /

Product

device / transistor / transistors / cases / memory cell / devices / location / /

Technology

semiconductor / physical analysis technology / laser / silicon chip / diagnosis algorithm / simulation / SRAM / failure analysis technologies / Physical Analysis Technology Analysis technologies / failure analysis technology / /

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