Physical Electronics 5400 ESCA (XPS) (X-ray Photoelectron Spectroscopy) Elemental composition All elements except H and He Oxidation states

First Page		Document Content
Date: 2013-11-15 16:05:43 Electron microscopy Microscopes Spectroscopy Microscopy Electron beam Electron microscope Scanning electron microscope Focused ion beam Transmission electron microscopy Scanning transmission electron microscopy Electron microprobe Raman microscope		Physical Electronics 5400 ESCA (XPS) (X-ray Photoelectron Spectroscopy) Elemental composition All elements except H and He Oxidation states Add to Reading List Source URL: www.ampac.ucf.edu Download Document from Source Website File Size: 37,27 KB Share Document on Facebook

	IEEE TRANSACTIONS ON MAGNETICS, VOL. 37, NO. 4, JULYMagnetic Properties of Fe Microstructures with Focused Ion Beam-Fabricated Nano-Constrictions DocID: 1vfvg - View Document
	Physical Geography, 2013 Vol. 34, No. 3, 159–173, http://dx.doi.orgVarnish microlaminations: new insights from focused ion beam preparation David Krinsleya, Jeffrey Dittob, Kurt Langworthy DocID: 1sq0k - View Document
	Nano Wired V O L U M E NREC MISSION  DocID: 1qzYt - View Document
	SCANNING VOL. 33, 78–) & Wiley Periodicals, Inc. Investigation of Tibetian Plateau Varnish: New Findings at the Nanoscale Using Focused Ion Beam and Transmission Electron Microscopy Techniques DocID: 1pOa6 - View Document
	Precambrian Research–54 Focussed ion beam preparation and in situ nanoscopic study of Precambrian acritarchs Andr´e Kempe a,1 , Richard Wirth b , Wladyslaw Altermann c,∗ , Robert W. Stark a , J. Willi DocID: 1p8Ij - View Document