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OCVD 法によるダイヤモンド p-i-n ダイオードのキャリア寿命測定 Carrier lifetime in diamond p-i-n diode by Open Circuit Voltage Decay method (OCVD) ○ A. Traore1, A. Nakajima1, T. Makino1, D. Kuwaba
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Document Date: 2017-11-01 22:26:41
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OCVD 法によるダイヤモンド p-i-n ダイオードのキャリア寿命測定 Carrier lifetime in diamond p-i-n diode by Open Circuit Voltage Decay method (OCVD) ○ A. Traore1, A. Nakajima1, T. Makino1, D. Kuwaba