usual qubit energy relaxation / induced qubit energy relaxation time / energy leakage rate / test chip / fault tolerant protocols / fault tolerant protocol / /
Organization
U.S. Government / University of California / Santa Barbara / National Intelligence / John M. Martinis* Department of Physics / /
Person
L. S. Bishop / R. Schoelkopf / J. Majer / K. Murch / I. Siddiqi / S. Boutin / Daniel Sank / A. Wallraff / S. J. Weber / A. Blais / J. Gambetta / R. J. Schoelkopf / S. Weber / W. A. Braff / D. Schuster / L. Frunzio / A. Nunnenkamp / C. Macklin / J. Chow / J. M. Gambetta / John M. Martinis / Evan Jeffrey / S. Huang / M. H. Devoret / M. Boissonneault / S. M. Girvin / /