<--- Back to Details
First PageDocument Content
Biology / DNA nanotechnology / California Institute of Technology faculty / Science and technology in the United States / Higher education in China / MacArthur Fellows / Erik Winfree / DNA computing / Qian / DNA / John Reif / California Institute of Technology
Biology
DNA nanotechnology
California Institute of Technology faculty
Science and technology in the United States
Higher education in China
MacArthur Fellows
Erik Winfree
DNA computing
Qian
DNA
John Reif
California Institute of Technology

Lulu Qian Assistant Professor of Bioengineering California Institute of Technology Mail CodeE California Blvd Pasadena, CA 91125

Add to Reading List

Source URL: www.qianlab.caltech.edu

Download Document from Source Website

File Size: 442,88 KB

Share Document on Facebook

Similar Documents

Reflections on papers by: Tullao and Rivera, “The Impact of Temporary Labor Migration on the Demand for Higher Education and its Implications for Human Resource Development in the Philippines” and

Reflections on papers by: Tullao and Rivera, “The Impact of Temporary Labor Migration on the Demand for Higher Education and its Implications for Human Resource Development in the Philippines” and

DocID: 1rs5G - View Document

MISSOURI STATE UNIVERSITY  China Connections Academic Year 2009 Annual Report  Page 2

MISSOURI STATE UNIVERSITY China Connections Academic Year 2009 Annual Report Page 2

DocID: 1rnHf - View Document

ID  Institutions No. lines

ID Institutions No. lines

DocID: 1rlPK - View Document

2013 MTT-S  workshop series on “RF and Wireless Technologies and Medical and  Healthcare Applications” in Singapore

2013 MTT-S workshop series on “RF and Wireless Technologies and Medical and Healthcare Applications” in Singapore

DocID: 1rjrp - View Document

2009 年 EI Compendex 收录我校教师论文情况统计表 (共 211 篇) 1. Fault diagnosis in TE process based on feature selection via second order mutual information Lü, Ning (School of Automation, Harbin Univ

2009 年 EI Compendex 收录我校教师论文情况统计表 (共 211 篇) 1. Fault diagnosis in TE process based on feature selection via second order mutual information Lü, Ning (School of Automation, Harbin Univ

DocID: 1rj2M - View Document