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Chemistry / Matter / Manufacturing / Ceramic materials / Semiconductor device fabrication / Thin film deposition / Plasma processing / Anions / Chemical vapor deposition / Silicon nitride / Silicon dioxide / Plasma-enhanced chemical vapor deposition
Date: 2014-07-22 13:23:02
Chemistry
Matter
Manufacturing
Ceramic materials
Semiconductor device fabrication
Thin film deposition
Plasma processing
Anions
Chemical vapor deposition
Silicon nitride
Silicon dioxide
Plasma-enhanced chemical vapor deposition

www.afm-journal.de www.MaterialsViews.com Seung-Kyun Kang, Suk-Won Hwang, Huanyu Cheng, Sooyoun Yu, Bong Hoon Kim, Jae-Hwan Kim, Yonggang Huang, and John A. Rogers*

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Source URL: rogers.matse.illinois.edu

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